LEADER 01476nam 2200349 450 001 9910137547003321 005 20231206213735.0 010 $a1-5044-0173-5 024 7 $a10.1109/IEEESTD.1971.7369911 035 $a(CKB)3710000000553773 035 $a(NjHacI)993710000000553773 035 $a(EXLCZ)993710000000553773 100 $a20231206d1971 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std 161-1971 $eIEEE standard definitions on electron tubes /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cIEEE,$d1971. 215 $a1 online resource (30 pages) 330 $aMany definitions in this standard are applicable to devices other than electron tubes especially semiconductor devices. These definitions have been made as general as possible, but it should always be remembered, in interpreting these definitions that they are primarily written for electron tubes. IEEE Std 161-1971, consists of IEEE Std 160-1957 as revised in part by the clarified definitions of "noise factor" and "noise temperature" in IEEE Std 161-1962. 517 $aIEEE Std 161-1971 606 $aElectron tubes 615 0$aElectron tubes. 676 $a621.38151 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910137547003321 996 $aIEEE Std 161-1971$93646786 997 $aUNINA