LEADER 01548nam 2200421 450 001 9910136585103321 005 20230808195953.0 010 $a1-78552-143-8 010 $a1-78552-185-3 035 $a(CKB)3710000000903211 035 $a(EBL)4718375 035 $a(MiAaPQ)EBC4718375 035 $a(EXLCZ)993710000000903211 100 $a20161021d2016 uy| 0 101 0 $aeng 135 $aur|n|---||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aBetween nationalism and Europeanisation $enarratives of national identity in Bulgaria and Macedonia /$fNevena Nancheva 210 1$aColchester :$cECPR Press,$d2016. 215 $a1 online resource (220 p.) 300 $aDescription based upon print version of record. 320 $aIncludes bibliographical references and index. 330 $aCombining discourse analysis with historical and foreign policy analysis into a framework for the study of national identity change, the book offers a unique insight into the mechanisms of public re-narration of the national stories in the context of the EU enlargement agenda in Bulgaria and in Macedonia. 606 $aNationalism 607 $aBulgaria 607 $aMacedonia 607 $aEuropean Union countries 615 0$aNationalism. 700 $aNancheva$b Nevena$01377466 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910136585103321 996 $aBetween nationalism and Europeanisation$93414754 997 $aUNINA LEADER 01563oam 2200433Ia 450 001 9910699339303321 005 20230902162202.0 035 $a(CKB)5470000002402524 035 $a(OCoLC)227908497 035 $a(EXLCZ)995470000002402524 100 $a20080513d2006 ua 0 101 0 $aeng 135 $aurmn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aPulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor$b[electronic resource] /$fby Timothy E. Griffin 210 1$aAdelphi, MD :$cArmy Research Laboratory,$d[2006] 215 $a1 online resource (vi, 22 pages) $cillustrations 225 1 $aARL-TR ;$v3993 300 $aTitle from PDF title screen (ARL, viewed Mar. 23, 2010). 300 $a"November 2006." 410 0$aARL-TR (Aberdeen Proving Ground, Md.) ;$v3993. 517 $aPulsed capacitance measurement of silicon carbide 606 $aPulsed power systems 606 $aDiodes, Schottky-barrier 606 $aMetal oxide semiconductors 615 0$aPulsed power systems. 615 0$aDiodes, Schottky-barrier. 615 0$aMetal oxide semiconductors. 700 $aGriffin$b Timothy E$01391748 712 02$aU.S. Army Research Laboratory. 801 0$bDTICE 801 1$bDTICE 801 2$bGPO 906 $aBOOK 912 $a9910699339303321 996 $aPulsed capacitance measurement of silicon carbide (SiC) Schottky diode and SiC metal oxide semiconductor$93471624 997 $aUNINA