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001 9910136425903321
005 20180314144130.0
010   $a1-4673-9913-2
035   $a(CKB)3710000000609602
035   $a(WaSeSS)IndRDA00094894
035   $a(EXLCZ)993710000000609602
100   $a20180314d2016      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 14$aThe 17th IEEE International Symposium on High Assurance Systems Engineering $e7-9 January 2016, Orlando, Florida /$fedited by Radu Babiceanu, Helene Waeselynck, Raymond A. Paul, Bojan Cukic, Jie Xu
210  1$aNew York :$cIEEE,$d2016.
215   $a1 online resource (300 pages)
300   $aIncludes index.
311   $a1-4673-9914-0 
606   $aSoftware engineering$vCongresses
606   $aComputer input-output equipment$vCongresses
606   $aReliability (Engineering)$vCongresses
615  0$aSoftware engineering
615  0$aComputer input-output equipment
615  0$aReliability (Engineering)
702   $aBabiceanu$b Radu
702   $aWaeselynck$b Helene
702   $aPaul$b Raymond A.
702   $aCukic$b Bojan
702   $aXu$b Jie
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910136425903321
996   $aThe 17th IEEE International Symposium on High Assurance Systems Engineering$92528397
997   $aUNINA