LEADER 01391nam 2200373 450 001 9910136383603321 005 20231206214306.0 010 $a1-5044-0596-X 024 7 $a10.1109/IEEESTD.2016.7436703 035 $a(CKB)3710000000614411 035 $a(NjHacI)993710000000614411 035 $a(EXLCZ)993710000000614411 100 $a20231206d2016 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003) $eIEEE Standard for Boundary-Scan Testing of Advanced Digital Networks /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ, USA :$cIEEE,$d2016. 215 $a1 online resource (230 pages) 330 $aIEEE Std 1149.1(TM) is augmented by this standard to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems. 517 $aIEEE Std 1149.6-2015 606 $aBoundary scan testing 606 $aMicroelectronics 615 0$aBoundary scan testing. 615 0$aMicroelectronics. 676 $a621.3815 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910136383603321 996 $aIEEE Std 1149.6-2015 (Revision of IEEE Std 1149.6-2003)$93646405 997 $aUNINA