LEADER 00965nam0-2200325li-450 001 990001202500203316 005 20170913150313.0 010 $a0-333-61792-4 035 $a000120250 035 $aUSA01000120250 035 $a(ALEPH)000120250USA01 035 $a000120250 100 $a2002003101995-------y0itay0103----ba 101 0 $aeng 102 $aGB 200 1 $aOptical communications$ecomponents and systems$fM. J. N. Sibley 205 $a2. ed 210 $aLondon [etc.]$cMacMillan$d1995 610 1 $aComunicazioni ottiche 676 $a621.3827 700 1$aSIBLEY,$bMartin J. N.$0742727 801 $aSistema bibliotecario di Ateneo dell' Università di Salerno$gRICA 912 $a990001202500203316 951 $a621.382 7 SIB (C)$b9303 Ing$c621.382 959 $aBK 969 $aTEC 979 $aSIAV6$b10$c20031017$lUSA01$h1542 979 $aPATRY$b90$c20040406$lUSA01$h1726 996 $aOptical communications$91476176 997 $aUNISA LEADER 01008nam a2200265 i 4500 001 991000508609707536 008 041025s1998 enka b 001 0 eng d 020 $a0750638982 035 $ab13231340-39ule_inst 040 $aDip.to Beni Arti e Storia$bita 082 00$a691/.2$221 245 00$aConservation of building and decorative stone /$ceditors, John Ashurst, Francis G. Dimes. 260 $aAmsterdam :$bElsevier,$c2004 300 $a254 p. :$bill. ;$c25 cm. 504 $aContiene bibliografia e indice. 650 4$aEdifici in pietra$xDeterioramento 650 4$aEdifici in pietra$xConservazione 700 1 $aAshurst, John. 700 1 $aDimes, Francis G. 907 $a.b13231340$b23-11-06$c25-10-04 912 $a991000508609707536 945 $aLE019 A11 AR C 36$g1$i2019000017626$lle019$op$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13906136$z25-10-04 996 $aConservation of building and decorative stone$91101495 997 $aUNISALENTO 998 $ale019$b25-10-04$cm$da $e-$feng$genk$h0$i0 LEADER 01753nam 2200373 450 001 9910136370103321 005 20231206214326.0 010 $a1-5044-0449-1 024 7 $a10.1109/IEEESTD.1963.7439707 035 $a(CKB)3710000000619005 035 $a(NjHacI)993710000000619005 035 $a(EXLCZ)993710000000619005 100 $a20231206d1963 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aIEEE Std 82-1963 $eIEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors /$fIEEE 210 1$a[Place of publication not identified] :$cIEEE,$d1963. 215 $a1 online resource 330 $aThis test procedure is intended as a guide for impulse testing of insulated conductors. It is intended only for use as a design or development test, and not as a routine production or specification test. Special needs may require deviations from this test procedure. A uniform procedure, however, is desirable in most cases. This test procedure applies only to impulse tests on insulated conductors. This test procedure is not intended to replace any existing or future standards covering impulse generators, impulse testing or voltage measurements. It is intended to supplement such standards by indicating specific procedures for a specific type of system component. 517 $aIEEE Std 82-1963 606 $aElectronic measurements 606 $aPulse generators 615 0$aElectronic measurements. 615 0$aPulse generators. 676 $a621.381548 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910136370103321 996 $aIEEE Std 82-1963$93646213 997 $aUNINA