LEADER 01943nam  2200349   450 
001 9910135876603321
005 20231207090155.0
010   $a0-7381-6066-0
035   $a(CKB)3780000000090169
035   $a(NjHacI)993780000000090169
035   $a(EXLCZ)993780000000090169
100   $a20231207d2009      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Std 1671.1-2009 $eIEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions /$fInstitute of Electrical and Electronics Engineers
210  1$aNew York :$cIEEE,$d2009.
215   $a1 online resource (viii, 185 pages) $cillustrations
330   $aThis document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT). This is in support of the development of test program sets (TPSs) that will be used in an automatic test environment. Keywords: automatic test equipment (ATE), Automatic Test Markup Language (ATML), Automatic Test Markup Language (ATML) instance document, automatic test system (ATS), diagnostic requirements, test description, Test Program Set (TPS), test requirements, Test Requirements Document (TRD), XML schema.
517   $a1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language 
517   $aIEEE Std 1671.1-2009
606   $aAutomatic test equipment
615  0$aAutomatic test equipment.
676   $a621.381548
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a9910135876603321
996   $aIEEE Std 1671.1-2009$93646652
997   $aUNINA