LEADER 01689nam  2200397   450 
001 9910135873603321
005 20231207090204.0
010   $a0-7381-9624-X
035   $a(CKB)3780000000090182
035   $a(NjHacI)993780000000090182
035   $a(EXLCZ)993780000000090182
100   $a20231207d2015      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Std 1671.6-2015 $eIEEE Standard for Automatic Test Markup Language (ATML) Test Station Description /$fIEEE
205   $a(Revision of IEEE Std 1671.6-2008).
210  1$aNew York, N.Y. :$cIEEE,$d2015.
215   $a1 online resource (viii, 34 pages) $cillustrations
320   $aIncludes bibliographical references.
330   $aAn exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.
517   $a1671.6-2015 - IEEE Standard for Automatic Test Markup Language 
517   $aIEEE Std 1671.6-2015 (Revision of IEEE Std 1671.6-2008): IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
517   $aIEEE Standard for Automatic Test Markup Language 
517   $aIEEE Std 1671.6-2015 
606   $aTesting$xData processing
615  0$aTesting$xData processing.
676   $a620.1
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a9910135873603321
996   $aIEEE Std 1671.6-2015$93646784
997   $aUNINA