LEADER 00708nam0-22003011i-450-
001 990003277080403321
005 20001010
035   $a000327708
035   $aFED01000327708
035   $a(Aleph)000327708FED01
035   $a000327708
100   $a20000920d1974----km-y0itay50------ba
101 0 $aita
105   $ay-------001yy
200 1 $aLIBYA
210   $aEngland$cPenguin Books$d1974
215   $app. 294
610 0 $aLibia
676   $a157.000
700  1$aFirst,$bRuth$0130404
801  0$aIT$bUNINA$gRICA$2UNIMARC
901   $aBK
912   $a990003277080403321
952   $a157.000.FIR$b1545$fDECGE
959   $aDECGE
996   $aLIBYA$9452011
997   $aUNINA
DB    $aING01

LEADER 01001nam a2200253 i 4500
001 991000633379707536
008 041118s2004    it a                ita  
035   $ab1324985x-39ule_inst
040   $aBiblioteca Interfacoltà$bita
082 04$a759.9492
100 1 $aBosch, Hieronymus$0484099
245 10$aBosch /$cpresentazione di Dino Buzzati
250   $aEd. speciale per il Corriere della Sera
260   $a[Milano] :$bRizzoli : Skira : Corriere della Sera,$c2004
300   $a189 p. :$billl. ;$c21 cm.
440  2$aI Classici dell'Arte [Corriere della Sera];$v28
500   $aSuppl. a: Corriere della Sera
700 1 $aBuzzati, Dino$eauthor$4http://id.loc.gov/vocabulary/relators/aut$0131411
907   $a.b1324985x$b02-04-14$c18-11-04
912   $a991000633379707536
945   $aLE002 Coll. 30.28$g1$i2002000400123$lle002$og$pE0.00$q-$rn$so  $t0$u0$v0$w0$x0$y.i13941173$z18-11-04
996   $aBosch$91460763
997   $aUNISALENTO
998   $ale002$b18-11-04$cm$da  $e-$fita$git $h0$i0

LEADER 01689nam  2200397   450 
001 9910135873603321
005 20231207090204.0
010   $a0-7381-9624-X
035   $a(CKB)3780000000090182
035   $a(NjHacI)993780000000090182
035   $a(EXLCZ)993780000000090182
100   $a20231207d2015      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Std 1671.6-2015 $eIEEE Standard for Automatic Test Markup Language (ATML) Test Station Description /$fIEEE
205   $a(Revision of IEEE Std 1671.6-2008).
210  1$aNew York, N.Y. :$cIEEE,$d2015.
215   $a1 online resource (viii, 34 pages) $cillustrations
320   $aIncludes bibliographical references.
330   $aAn exchange format, using extensible markup language (XML), for identifying all of the hardware, software, and documentation associated with a test station is specified in this document. This test station may be used with a test program set to test and diagnose a unit under test.
517   $a1671.6-2015 - IEEE Standard for Automatic Test Markup Language 
517   $aIEEE Std 1671.6-2015 (Revision of IEEE Std 1671.6-2008): IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
517   $aIEEE Standard for Automatic Test Markup Language 
517   $aIEEE Std 1671.6-2015 
606   $aTesting$xData processing
615  0$aTesting$xData processing.
676   $a620.1
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a9910135873603321
996   $aIEEE Std 1671.6-2015$93646784
997   $aUNINA