LEADER 01762nam 2200349 450 001 9910135764603321 005 20231206174007.0 010 $a0-7381-2776-0 024 7 $a10.1109/IEEESTD.1986.79645 035 $a(CKB)3780000000089242 035 $a(NjHacI)993780000000089242 035 $a(EXLCZ)993780000000089242 100 $a20231206d1986 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aANSI/IEEE Std 943-1986 $eIEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ :$cIEEE,$d1986. 215 $a1 online resource 330 $aBackground information necessary for proper construction of aging mechanisms and selection of diagnostic procedures when designing tests for functional evaluation of insulation systems for electrical equipment is presented. Aging mechanisms of insulation systems and methods for ascertaining correlation of aging during testing and aging during actual service are described. Diagnostic techniques for use in functional tests are also listed. The intent is primarily to aid committees in standardizing tests within the scope of their responsibilities. 517 $aANSI/IEEE Std 943-1986: IEEE Guide for Aging Mechanisms and Diagnostic Procedures in Evaluating Electrical Insulation Systems 606 $aElectric insulators and insulation$xTesting 615 0$aElectric insulators and insulation$xTesting. 676 $a621.31937 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910135764603321 996 $aANSI$92072434 997 $aUNINA