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010   $a0-7381-4016-3
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024 7 $a10.1109/IEEESTD.1972.81621
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100   $a20231206d1972      uy             0
101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
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200 10$aANSI/IEEE Std C37.26.1972 /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, NJ :$cIEEE,$d1972.
215   $a1 online resource (12 pages)
330   $aMethods used to measure the power factor in low-voltage test circuits are covered. Since the power factor measurement for high-capacity test circuits is particularly difficult, and different methods may yield different results, the methods that are least likely to yield errors are recommended for particular circuit conditions. The ratio method is recommended for fast clearing devices that may have total interruption times of 0.5 cycle or less. The DC decrement method is recommended for circuits with a 30% power factor or less when the device to be tested interrupts at a point in time more than 0.5 cycle from the initiation of the current. The phase relationship method, using current and voltage waves, is recommended for circuits having power factors over 30%.
517   $aANSI/IEEE Std C37.26.1972: IEEE Standard Guide for Methods of Power-Factor Measurement for Low-Voltage Inductive Test Circuits
606   $aElectric circuits
615  0$aElectric circuits.
676   $a621.3192
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a9910135759703321
996   $aANSI$92072434
997   $aUNINA