LEADER 01084nam  2200337   450 
001 9910135413803321
005 20231208095029.0
010   $a1-55937-350-4
010   $a0-7381-0959-2
035   $a(CKB)3780000000092665
035   $a(NjHacI)993780000000092665
035   $a(EXLCZ)993780000000092665
100   $a20231208d1990      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIEEE Standard Test Access Port and Boundary $eScan Architecture /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, NJ :$cIEEE,$d1990.
215   $a1 online resource
517   $aIEEE Std 1149.1-1990: IEEE Standard Test Access Port and Boundary - Scan Architecture
606   $aArchitectural design$xHistory
615  0$aArchitectural design$xHistory.
676   $a729
801  0$bNjHacI
801  1$bNjHacl
906   $aDOCUMENT
912   $a9910135413803321
996   $aIEEE Standard Test Access Port and Boundary$93647374
997   $aUNINA