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200 10$aIEEE Std C37.09b-2010 (Amendment to IEEE Std C37.09-1999) /$fInstitute of Electrical and Electronics Engineers
210  1$a[Place of publication not identified] :$cIEEE,$d2011.
215   $a1 online resource (13 pages)
330   $aThe descriptions of the standard transient recovery voltage (TRV) envelopes and ratings are changed in this amendment. This is applicable for ac high-voltage circuit breakers rated above 1000 V and on a symmetrical current basis. The capability limits of these circuit breakers are determined to a major degree by the TRV. The revised descriptions of TRV bring the TRV requirements in IEEE standards into harmony with the TRV requirements in IEC standards that apply to the same type and class of equipment. The TRV revisions addressed in this amendment to IEEE Std C37.09-1999 are described in amendment IEEE Std C37.04b ?2008.
517   $aP802.15.7/D4, Nov 2010 - IEEE Draft Standard for Information technology--Telecommunications and information exchange between systems--Local and metropolitan area networks--Specific requirements--Part 15.7
517   $aP802.15.7/D5, Feb 2011 - IEEE Draft Standard for Information technology--Telecommunications and information exchange between systems--Local and metropolitan area networks--Specific requirements--Part 15.7
517   $aP802.15.7/D7, Mar 2011 - IEEE Draft Standard for Information technology--Telecommunications and information exchange between systems--Local and metropolitan area networks--Specific requirements--Part 15.7
517   $aC37.09b-2010 - IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis -- Amendment 2
517   $aIEEE Std C37.09b-2010 (Amendment to IEEE Std C37.09-1999): IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis -- Amendment 2: To Change the Description of Transient Recovery Voltage for Harmonization wi
517   $aIEEE P802.15.7/D4, November 2010
517   $aIEEE P802.15.7/D5, February 2011
517   $aIEEE P802.15.7/D7, March 2011
517   $aIEEE P802.15.7/D8, April 2011
517   $aIEEE Std C37.09b-2010 
606   $aTesting
606   $aNondestructive testing
615  0$aTesting.
615  0$aNondestructive testing.
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996   $aIEEE Std C37.09b-2010 (Amendment to IEEE Std C37.09-1999)$92577670
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