LEADER 01272nam  2200373   450 
001 9910134786003321
005 20230807220845.0
010   $a1-4673-7143-2
035   $a(CKB)3880000000021537
035   $a(WaSeSS)IndRDA00120209
035   $a(EXLCZ)993880000000021537
100   $a20200312d2015      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2015 Seventh International Conference on Measuring Technology and Mechatronics Automation $e13-14 June 2015, Nanchang, China /$fsponsored by IEEE Computer Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2015.
215   $a1 online resource (67 pages)
311   $a1-4673-7144-0 
311   $a1-4673-7142-4 
606   $aMechatronics$vCongresses
606   $aMeasuring instruments$vCongresses
615  0$aMechatronics
615  0$aMeasuring instruments
676   $a621
712 02$aIEEE Computer Society,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910134786003321
996   $a2015 Seventh International Conference on Measuring Technology and Mechatronics Automation$92531113
997   $aUNINA