LEADER 03487nam 2200637 450 001 9910132342103321 005 20230803071611.0 010 $a1-118-91677-8 010 $a1-118-91678-6 010 $a1-118-91676-X 035 $a(CKB)3710000000224488 035 $a(EBL)1770689 035 $a(OCoLC)879329842 035 $a(SSID)ssj0001292790 035 $a(PQKBManifestationID)11765813 035 $a(PQKBTitleCode)TC0001292790 035 $a(PQKBWorkID)11284987 035 $a(PQKB)11734331 035 $a(MiAaPQ)EBC4039825 035 $a(OCoLC)891400216 035 $a(MiAaPQ)EBC1770689 035 $a(DLC) 2014017866 035 $a(Au-PeEL)EBL1770689 035 $a(CaPaEBR)ebr10913519 035 $a(PPN)188123830 035 $a(EXLCZ)993710000000224488 100 $a20140829h20142014 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aSecondary ion mass spectrometry $ean introduction to principles and practices /$fPaul van der Heide 210 1$aHoboken, New Jersey :$cWiley,$d2014. 210 4$dİ2014 215 $a1 online resource (365 p.) 225 1 $aTHEi Wiley ebooks 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-118-48048-1 311 $a1-322-07843-2 320 $aIncludes bibliographical references and index. 327 $aMachine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes. 330 $a"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--$cProvided by publisher. 410 0$aTHEi Wiley ebooks. 606 $aSecondary ion mass spectrometry 615 0$aSecondary ion mass spectrometry. 676 $a543/.65 686 $aSCI013010$2bisacsh 700 $aVan der Heide$b Paul$f1962-$0900477 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910132342103321 996 $aSecondary ion mass spectrometry$92240638 997 $aUNINA