LEADER 02208oam 2200445zu 450 001 9910130802303321 005 20241212220426.0 010 $a9781467320856 010 $a1467320854 024 7 $a10.1109/IOLTS20173.2012 035 $a(CKB)3420000000000795 035 $a(SSID)ssj0000821023 035 $a(PQKBManifestationID)12370491 035 $a(PQKBTitleCode)TC0000821023 035 $a(PQKBWorkID)10870114 035 $a(PQKB)10387699 035 $a(NjHacI)993420000000000795 035 $a(EXLCZ)993420000000000795 100 $a20160829d2012 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2012 IEEE 18th International on-Line Testing Symposium 210 31$a[Place of publication not identified]$cIEEE$d2012 215 $a1 online resource $cillustrations 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9781467320825 311 08$a146732082X 330 $aConventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques. 606 $aElectronic circuit design$vCongresses 615 0$aElectronic circuit design 676 $a621 702 $aIEEE Staff 801 0$bPQKB 906 $aPROCEEDING 912 $a9910130802303321 996 $a2012 IEEE 18th International on-Line Testing Symposium$92529052 997 $aUNINA LEADER 02352oas 2200865 a 450 001 9910132125403321 005 20251105213014.0 011 $a1936-6469 035 $a(DE-599)ZDB2270654-9 035 $a(DE-599)2270654-9 035 $a(OCoLC)123231711 035 $a(CONSER) 2007213019 035 $a(CKB)110978979118349 035 $a(EXLCZ)99110978979118349 100 $a20070418a19859999 uy a 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aJournal of police and criminal psychology 210 $a[Park Ridge, Ill.] $c[London House]$d1985- 210 2 $aNorwell, MA $cSpringer Verlag Boston 210 3 $aSecaucus, NJ $cSpringer Science+Business Media, LLC 215 $a1 online resource 300 $aRefereed/Peer-reviewed 311 08$a0882-0783 517 3 $aJ Police Crim Psych 606 $aCrime$vPeriodicals 606 $aPolice psychology$vPeriodicals 606 $aCriminal psychology$vPeriodicals 606 $aPsychologie policie?re$vPe?riodiques 606 $aCrime$2fast$3(OCoLC)fst00882984 606 $aCriminal psychology$2fast$3(OCoLC)fst00883467 606 $aPolice psychology$2fast$3(OCoLC)fst01068657 606 $aPsicologia criminal$2thub 606 $aPolicia$2thub 608 $aPeriodicals.$2fast 608 $aRevistes electròniques.$2thub 615 0$aCrime 615 0$aPolice psychology 615 0$aCriminal psychology 615 6$aPsychologie policie?re 615 7$aCrime. 615 7$aCriminal psychology. 615 7$aPolice psychology. 615 7$aPsicologia criminal. 615 7$aPolicia. 712 02$aSociety of Police and Criminal Psychology. 801 0$bNSD 801 1$bNSD 801 2$bHNK 801 2$bNSD 801 2$bOCLCQ 801 2$bTXA 801 2$bCSU 801 2$bOCLCQ 801 2$bCUI 801 2$bOCLCF 801 2$bOCLCO 801 2$bOCLCQ 801 2$bAU@ 801 2$bVT2 801 2$bNJT 801 2$bDLC 801 2$bOCLCQ 801 2$bIOY 801 2$bUEJ 801 2$bSXB 801 2$bOCLCL 801 2$bOCLCQ 906 $aJOURNAL 912 $a9910132125403321 996 $aJournal of police and criminal psychology$92022488 997 $aUNINA