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200 10$a2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
210 31$a[Place of publication not identified]$cIEEE$d2012
215   $a1 online resource (408 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
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606   $aIntegrated circuits$xDefects$vCongresses
606   $aIntegrated circuits$xDesign and construction$vCongresses
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