LEADER 01072nkm2-2200337---450- 001 990010069220403321 005 20160506115717.0 035 $a001006922 035 $aFED01001006922 035 $a(Aleph)001006922FED01 035 $a001006922 100 $a20160506f19501970km-y0itay50------ba 101 0 $aeng 102 $aGB 116 $afe-b-------------- 200 1 $aHuman aspects$bRisorsa grafica$fby W. B. Fisher$gproduced for the London County Council 210 $aLondon$cEducational productions ltd$ds. d. 215 $a1 filmina (50 fotogrammi)$cverticale, positiva, b/n, in scatolina di metallo (diametro 5 cm) 461 0$1001001006920 610 0 $aSiria$aImmagini 610 0 $aLibano$aImmagini 610 0 $aMedio Oriente$aImmagini 700 1$aFisher,$bWilliam Bayne$f<1916-1984> 712 02$aEducational production$c 712 02$aLONDON COUNTY COUNCIL 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aGR 912 $a990010069220403321 952 $aScat. Film 01(031)2$bIst. s.i.$fILFGE 959 $aILFGE 997 $aUNINA LEADER 03807nam 2200673Ia 450 001 9910451262803321 005 20210617024820.0 010 $a1-281-22344-1 010 $a9786611223441 010 $a0-226-26186-7 024 7 $a10.7208/9780226261867 035 $a(CKB)1000000000412241 035 $a(EBL)408603 035 $a(OCoLC)476229840 035 $a(SSID)ssj0000276171 035 $a(PQKBManifestationID)11213703 035 $a(PQKBTitleCode)TC0000276171 035 $a(PQKBWorkID)10223243 035 $a(PQKB)11398144 035 $a(MiAaPQ)EBC408603 035 $a(DE-B1597)535479 035 $a(OCoLC)781255462 035 $a(DE-B1597)9780226261867 035 $a(Au-PeEL)EBL408603 035 $a(CaPaEBR)ebr10216995 035 $a(CaONFJC)MIL122344 035 $a(EXLCZ)991000000000412241 100 $a19821101d1982 uy 0 101 0 $aeng 135 $aurnn#---|u||u 181 $ctxt 182 $cc 183 $acr 200 04$aThe youth labor market problem$b[electronic resource] $eits nature, causes, and consequences /$fedited by Ricard B. Freeman and David A. Wise 210 $aChicago $cUniversity of Chicago Press$d1982 215 $a1 online resource (568 p.) 225 1 $aA National Bureau of Economic Research conference report 300 $aDescription based upon print version of record. 311 0 $a0-226-26161-1 320 $aIncludes bibliographies and indexes. 327 $tFront matter --$tContents --$t1. The Youth Labor Market Problem: Its Nature Causes and Consequences --$t2. Teenage Unemployment: What is the Problem? --$t3. The Youth Labor Market Problem in the United States: An Overview --$t4. Why Does the Rate of Youth Labor Force Activity Differ across Surveys? --$t5. Economic Determinants of Geographic and Individual Variation in the Labor Market Position of Young Persons --$t6. Time Series Changes in Youth Joblessness --$t7. The Dynamics of Youth Unemployment --$t8. Labor Turnover and Youth Unemployment --$t9. High School Preparation and Early Labor Force Experience --$t10. Teenage Unemployment: Permanent Scars or Temporary Blemishes? --$t1.1 The Employment and Wage Consequences of Teenage Women's Nonemployment --$t12. Dead-end Jobs and Youth Unemployment --$t13. Family Effects in Youth Employment --$t14. The Minimum Wage and Job Turnover in Markets for Young Workers --$t15. Youth Unemployment in Britain and the United States Compared --$tContributors --$tAuthor Index --$tSubject Index 330 $aThis volume brings together a massive body of much-needed research information on a problem of crucial importance to labor economists, policy makers, and society in general: unemployment among the young. The thirteen studies detail the ambiguity and inadequacy of our present standard statistics as applied to youth employment, point out the error in many commonly accepted views, and show that many critically important aspects of this problem are not adequately understood. These studies also supply a significant amount of raw data, furnish a platform for further research and theoretical work in labor economics, and direct attention to promising avenues for future programs. 410 0$aConference report (National Bureau of Economic Research) 606 $aWorking class$vCongresses 606 $aYouth$xEmployment$vCongresses 608 $aElectronic books. 615 0$aWorking class 615 0$aYouth$xEmployment 676 $a331.3/412 676 $a331.3412 701 $aFreeman$b Richard B$g(Richard Barry),$f1943-$0118990 701 $aWise$b David A$0124389 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910451262803321 996 $aThe youth labor market problem$91946285 997 $aUNINA LEADER 05598nam 2200685Ia 450 001 9910454319803321 005 20200520144314.0 010 $a1-281-93459-3 010 $a9786611934590 010 $a981-279-470-0 035 $a(CKB)1000000000537774 035 $a(EBL)1679457 035 $a(OCoLC)879074235 035 $a(SSID)ssj0000232126 035 $a(PQKBManifestationID)11193207 035 $a(PQKBTitleCode)TC0000232126 035 $a(PQKBWorkID)10227110 035 $a(PQKB)11288777 035 $a(MiAaPQ)EBC1679457 035 $a(WSP)00005607 035 $a(Au-PeEL)EBL1679457 035 $a(CaPaEBR)ebr10255983 035 $a(CaONFJC)MIL193459 035 $a(EXLCZ)991000000000537774 100 $a20060316d2004 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aRadiation effects and soft errors in integrated circuits and electronic devices$b[electronic resource] /$feditors, R.D. Schrimpf, D.M. Fleetwood 210 $aSingapore ;$aNew Jersey $cWorld Scientific Pub.$dc2004 215 $a1 online resource (349 p.) 225 1 $aSelected topics in electronics and systems ;$vvol. 34 300 $aAlso published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623. 311 $a981-238-940-7 320 $aIncludes bibliographical references. 327 $aCONTENTS ; Preface ; Single Event Effects in Avionics and on the Ground ; 1. Introduction ; 2. Similarities between SEE in Avionics and on the Ground ; 3. Differences Between SEE in Avionics and on the Ground ; 4. Atmospheric and Ground Level Environments ; 5. SEE Data in devices 327 $a6. Summary Soft Errors in Commercial Integrated Circuits ; 1. Introduction ; 2. Scaling trends for memory devices ; 3. Seating trend for peripheral logic devices ; 4. Conclusion ; Single-Event Effects in lll-V Semiconductor Electronics ; 1. Introduction 327 $a2. Single-Event Effects in lll-V Electronic Devices 3. Summary and Conclusions ; Investigation of Single-Event Transients in Fast Integrated Circuits with a Pulsed Laser ; 1. Basic Mechanisms of a SET ; 2. SET Laser Testing ; 3. Experimental set-up for SET laser testing ; 4. Results 327 $a5. Conclusions System Level Single Event Upset Mitigation Strategies ; 1. Introduction ; 2. Systems Engineering for Energetic Particle Environment Compatibility ; 3. Fault Tolerant Systems Strategies ; Radiation-Tolerant Design for High Performance Mixed-Signal Circuits 327 $a1. Introduction 2. Radiation Mechanisms in Mixed-Signal Integrated Circuits ; 3. Process Component and Layout Choices for Hardened-by-Design Circuits ; 4. Total Dose Hardening ; 5. Single-Event Effect Hardening ; 6. Dose-Rate Effect Hardening ; 7. Conclusion 327 $aA Total-Dose Hardening-By-Design Approach for High-Speed Mixed-Signal CMOS Integrated Circuits 330 $a This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes t 410 0$aSelected topics in electronics and systems ;$vvol. 34. 606 $aElectronic circuits$xEffect of radiation on 606 $aIntegrated circuits$xEffect of radiation on 608 $aElectronic books. 615 0$aElectronic circuits$xEffect of radiation on. 615 0$aIntegrated circuits$xEffect of radiation on. 676 $a621.3815 701 $aSchrimpf$b Ronald Donald$0923727 701 $aFleetwood$b D. M$g(Dan M.)$0923728 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910454319803321 996 $aRadiation effects and soft errors in integrated circuits and electronic devices$92073051 997 $aUNINA