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001 990009313040403321
005 20110207111017.0
010   $a978-3-642-02416-0
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100   $a20110131d2010----km-y0itay50------ba
101 0 $aeng
105   $aa-------001yy
200 1 $aLock-in thermography$ebasics and use for evaluating electronic devices and materials$fO. Breitenstein, W. Warta, M. Langenkamp
205   $a2nd ed.
210   $aHeidelberg$cSpringer$d©2010
215   $a255 p.$cill.$d24 cm
225 1 $aSpringer series in advanced microelectronics$v10
610 0 $aStrumenti elettronici - Proprietą termiche
610 0 $aTermografia
676   $a621.381'548
700  1$aBreitenstein,$bOtwin$f<1953- >$0422827
701  1$aWarta,$bWilhelm$0324087
701  1$aLangenkamp,$bMartin$f<1964- >$0286871
801  0$aIT$bUNINA$gRICA$2UNIMARC
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952   $a10 E I 427$bDIBET 2415$fDINEL
959   $aDINEL
996   $aLock-in thermography$9771676
997   $aUNINA