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200 1 $aLock-in thermography$ebasics and use for functional diagnostics of electronic components$fO. Breitenstein, M. Langenkamp
210   $aBerlin$cSpringer$d2003
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225 1 $aSpringer series in advanced microelectronics$x1437-0387$v10
610 0 $aStrumenti elettronici - Proprietà termiche
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