LEADER 01064cam0-22003371i-450- 001 990004377880403321 005 20080610145129.0 010 $a90-272-3671-2 035 $a000437788 035 $aFED01000437788 035 $a(Aleph)000437788FED01 035 $a000437788 100 $a19990604d1998----km-y0itay50------ba 101 0 $aeng 102 $aNL 105 $ay-------001yy 200 1 $aLexical perspectives on transitivity and ergativity$ecausative constructions in english$fMaarten Lemmens 210 $aAmsterdam$cBenjamins$d1998 215 $aXII, 268 p.$d23 cm 225 1 $aAmsterdam studies in the theory and history of linguistic science$hSeries 4.$iCurrent issues in linguistic theory$v166 610 0 $aGrammatica 610 0 $aSemantica 676 $a415$v21$zit 700 1$aLemmens,$bMaarten$0175586 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990004377880403321 952 $a415 LEM 1$fFLFBC 959 $aFLFBC 996 $aLexical perspectives on transitivity and ergativity$9542092 997 $aUNINA LEADER 01263aam 2200373I 450 001 9910710021903321 005 20151118015328.0 024 8 $aGOVPUB-C13-98f73c2e4204d40323f507d1232a30eb 035 $a(CKB)5470000002476061 035 $a(OCoLC)929882704 035 $a(EXLCZ)995470000002476061 100 $a20151118d1976 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 14$aThe structure of slow crack interfaces in silicon nitride /$fN. J. Tighe 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1976. 215 $a1 online resource 225 1 $aNBSIR ;$v76-1075 300 $a1976. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 700 $aTighe$b N. J$01387899 701 $aTighe$b N. J$01387899 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710021903321 996 $aThe structure of slow crack interfaces in silicon nitride$93438209 997 $aUNINA LEADER 01396nam0 22003493i 450 001 PUV0345231 005 20251003044312.0 010 $a0471967920 100 $a20121009d1997 ||||0itac50 ba 101 | $aeng 102 $agb 181 1$6z01$ai $bxxxe 182 1$6z01$an 183 1$6z01$anc$2RDAcarrier 200 1 $aWavelets$etheory and applications$fA. K. Louis, P. Maass, A. Rieder 210 $aChichester (U.K.)$cJ. Wiley$dc1997 215 $aXVII, 324 p.$d24 cm 225 | $aPure and applied mathematics$ea Wiley-Interscience series of texts, monographs, and tracts 410 0$1001MIL0004566$12001 $aPure and applied mathematics$ea Wiley-Interscience series of texts, monographs, and tracts 606 $aWAVELETS $2FIR$3MILC067248$9I 676 $a515.2433$9Analisi di Fourier e analisi in serie di funzioni$v21 700 1$aLouis$b, Alfred K.$3MILV108084$4070$0437803 701 1$aMaass$b, Peter$3MILV171561$4070$0437804 701 1$aRieder$b, A.$3PUVV178131$4070$0437805 801 3$aIT$bIT-000000$c20121009 850 $aIT-BN0095 901 $bNAP 01$cM/S $n$ 912 $aPUV0345231 950 0$aBiblioteca Centralizzata di Ateneo$d 01M/S (C) 22 0188$e 01C 8002201885 VMA 1 v.$fY $h20121009$i20121009 977 $a 01 996 $aWavelets$965900 997 $aUNISANNIO