LEADER 00984nam0-2200361---450 001 990003751680403321 005 20220627152952.0 010 $a88-420-2666-2 035 $a000375168 100 $a20030910d1986----km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aOscar Lewis$ebiografo della povertà$fLaura Ferrarotti 205 $a1.ed. 210 $aBari$cLaterza$d1986 215 $aVI, 135 p.$d22 cm 225 1 $aBiblioteca di cultura moderna$v925 610 0 $aLewis Oscar (antropologo, 1914- 1970)$aStudi 610 0 $aPovertà 676 $a306.0924 676 $a362.5$v22$zita 700 1$aFerrarotti,$bLaura$0125998 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990003751680403321 952 $a13110 FER$b4577$fSES 952 $aLW 306.092 FER 1$b978$fBFS 952 $a306.92 FER 1$bBibl.78$fFLFBC 959 $aBFS 959 $aSES 959 $aFLFBC 996 $aOscar Lewis$9508400 997 $aUNINA LEADER 05388nam 22009135 450 001 9910300395803321 005 20200701064503.0 010 $a3-319-05750-2 024 7 $a10.1007/978-3-319-05750-7 035 $a(CKB)2560000000148911 035 $a(EBL)1697946 035 $a(OCoLC)881165908 035 $a(SSID)ssj0001204898 035 $a(PQKBManifestationID)11798929 035 $a(PQKBTitleCode)TC0001204898 035 $a(PQKBWorkID)11180356 035 $a(PQKB)11672209 035 $a(MiAaPQ)EBC1697946 035 $a(DE-He213)978-3-319-05750-7 035 $a(PPN)178321931 035 $a(EXLCZ)992560000000148911 100 $a20140408d2014 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aFerroelectric Domain Walls $eStatics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy /$fby Jill Guyonnet 205 $a1st ed. 2014. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2014. 215 $a1 online resource (167 p.) 225 1 $aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 300 $a"Doctoral Thesis accepted by the University of Geneva, Switzerland." 311 $a3-319-05749-9 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aIntroduction -- Domain Walls in Ferroelectric Materials -- Experimental Setup -- Lateral Piezoelectric Response Across Ferroelectric Domain Walls -- Electrical Conduction at 180° Ferroelectric Domain Walls -- A Statistical Approach to Domain Wall Roughening and Dynamics: Disordered Elastic Systems -- Measuring the Roughness Exponent of One-Dimensional Interfaces -- Roughness Analysis of 180° Ferroelectric Domain Walls -- Disorder and Environmental Effects on Nanodomain Growth -- Conclusions -- Appendix A Displacement Autocorrelation Function Scaling for Super-Rough Interfaces -- Appendix B AFM for the Eye. 330 $aUsing the nanometric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nanoscale interfaces separating regions of differently oriented spontaneous polarization. Due to the local symmetry-breaking caused by the change in polarization, domain walls are found to possess an unexpected lateral piezoelectric response, even when this is symmetry-forbidden in the parent material. This has interesting potential applications in electromechanical devices based on ferroelectric domain patterning. Moreover, electrical conduction is shown to arise at domain walls in otherwise insulating lead zirconate titanate, the first such observation outside of multiferroic bismuth ferrite, due to the tendency of the walls to localize defects. The role of defects is then explored in the theoretical framework of disordered elastic interfaces possessing a characteristic roughness scaling and complex dynamic response. It is shown that the heterogeneous disorder landscape in ferroelectric thin films leads to a breakdown of the usual self-affine roughness, possibly related to strong pinning at individual defects. Finally, the roles of varying environmental conditions and defect densities in domain switching are explored, and shown to be adequately modelled as a competition between screening effects and pinning. 410 0$aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aOptical materials 606 $aElectronics$xMaterials 606 $aSpectrum analysis 606 $aMicroscopy 606 $aNanotechnology 606 $aNanoscience 606 $aNanoscience 606 $aNanostructures 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aOptical and Electronic Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z12000 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 615 0$aSurfaces (Physics) 615 0$aInterfaces (Physical sciences) 615 0$aThin films. 615 0$aOptical materials. 615 0$aElectronics$xMaterials. 615 0$aSpectrum analysis. 615 0$aMicroscopy. 615 0$aNanotechnology. 615 0$aNanoscience. 615 0$aNanoscience. 615 0$aNanostructures. 615 14$aSurface and Interface Science, Thin Films. 615 24$aOptical and Electronic Materials. 615 24$aSpectroscopy and Microscopy. 615 24$aNanotechnology. 615 24$aNanoscale Science and Technology. 676 $a538.3 700 $aGuyonnet$b Jill$4aut$4http://id.loc.gov/vocabulary/relators/aut$0791813 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910300395803321 996 $aFerroelectric Domain Walls$91770431 997 $aUNINA