LEADER 00879nam0-22003131i-450- 001 990001134150403321 035 $a000113415 035 $aFED01000113415 035 $a(Aleph)000113415FED01 035 $a000113415 100 $a20000920d1966----km-y0itay50------ba 101 1$aeng 200 1 $aPartial Differential Equations$fby Bers , John and Schechter 210 $aNew York$cInterscience$d1966 225 1 $aLecture in applied mathematics 300 $aVol. III 610 0 $aEquazioni differenziali alle derivate parziali 700 1$aBers,$bLipman$044849 702 1$aJohn,$bFritz 702 1$aSchechter,$bMartin 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990001134150403321 952 $a4-L-14$b8771$fMA1 959 $aMA1 962 $a35-01 996 $aPartial Differential Equations$9345252 997 $aUNINA DB $aING01 LEADER 04647nam 22007935 450 001 9910300430303321 005 20200705120632.0 010 $a3-319-14367-0 024 7 $a10.1007/978-3-319-14367-5 035 $a(CKB)3710000000356752 035 $a(EBL)1973835 035 $a(SSID)ssj0001452167 035 $a(PQKBManifestationID)11859293 035 $a(PQKBTitleCode)TC0001452167 035 $a(PQKBWorkID)11480159 035 $a(PQKB)10997402 035 $a(DE-He213)978-3-319-14367-5 035 $a(MiAaPQ)EBC1973835 035 $a(PPN)184498252 035 $a(EXLCZ)993710000000356752 100 $a20150209d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aDefects at Oxide Surfaces /$fedited by Jacques Jupille, Geoff Thornton 205 $a1st ed. 2015. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2015. 215 $a1 online resource (472 p.) 225 1 $aSpringer Series in Surface Sciences,$x0931-5195 ;$v58 300 $aDescription based upon print version of record. 311 $a3-319-14366-2 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aFrom the Contents: Numerical simulations of defective structures -- Modeling oxygen vacancies -- Role of surface defects in photocatalysis -- Chemical activity of defects -- Nature of defects as determined by scanning probe tip-surface interactions. 330 $aThis book presents the basics and characterization of defects at oxide surfaces. It provides a state-of-the-art review of the field, containing information to the various types of surface defects, describes analytical methods to study defects, their chemical activity and the catalytic reactivity of oxides. Numerical simulations of defective structures complete the picture developed. Defects on planar surfaces form the focus of much of the book, although the investigation of powder samples also form an important part. The experimental study of planar surfaces opens the possibility of applying the large armoury of techniques that have been developed over the last half-century to study surfaces in ultra-high vacuum. This enables the acquisition of atomic level data under well-controlled conditions, providing a stringent test of theoretical methods. The latter can then be more reliably applied to systems such as nanoparticles for which accurate methods of characterization of structure and electronic properties have yet to be developed. The book gives guidance to tailor oxide surfaces by controlling the nature and concentration of defects. The importance of defects in the physics and chemistry of metal oxide surfaces is presented in this book together with the prominent role of oxides in common life. The book contains contributions from leaders in the field. It serves as a reference for experts and beginners in the field. 410 0$aSpringer Series in Surface Sciences,$x0931-5195 ;$v58 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aOptical materials 606 $aElectronics$xMaterials 606 $aMaterials?Surfaces 606 $aChemistry, Physical and theoretical 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aOptical and Electronic Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z12000 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aPhysical Chemistry$3https://scigraph.springernature.com/ontologies/product-market-codes/C21001 615 0$aSurfaces (Physics) 615 0$aInterfaces (Physical sciences) 615 0$aThin films. 615 0$aOptical materials. 615 0$aElectronics$xMaterials. 615 0$aMaterials?Surfaces. 615 0$aChemistry, Physical and theoretical. 615 14$aSurface and Interface Science, Thin Films. 615 24$aOptical and Electronic Materials. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aPhysical Chemistry. 676 $a546.7212 702 $aJupille$b Jacques$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aThornton$b Geoff$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910300430303321 996 $aDefects at Oxide Surfaces$91771530 997 $aUNINA