LEADER 01294nam0-22003731i-450- 001 990001097290403321 010 $a0-306-43236-6 035 $a000109729 035 $aFED01000109729 035 $a(Aleph)000109729FED01 035 $a000109729 100 $a20000920d1989----km-y0itay50------ba 101 0 $aeng 200 1 $aAdvances in X-Ray Analysis$eProceedings on the 37th Annual Denver Conference held August 1-5, 1988 in Steamboat Springs, Colorado$fEdited by Charles S. Barrett, J. V. Gilfrich, Ron Jenkins, Ting C. Huang and Paul K. Predecki 210 $aNew York [etc.]$cPlenum Press$d1989 215 $axxv, 681 p. , 25 cm 225 1 $aAdvances in X-Ray Analysis$v32 300 $aSponsored by University of Denver Department of Engineering and JCPDS - International Centre for Diffraction Data. 610 0 $aCristallografia 610 0 $aRaggi x 676 $a548 700 1$aBarrett,$bCharles Sanborn$018908 702 1$aGilfrich,$bJohn V. 702 1$aHuang,$bTing C. 702 1$aJenkins,$bRon 702 1$aPredecki,$bPaul K. 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990001097290403321 952 $a37-025.031$b16997$fFI1 959 $aFI1 996 $aAdvances in X-Ray Analysis$9335256 997 $aUNINA DB $aING01