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101 0 $aeng
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200 1 $aSoftware reliability$emeasurement, prediction, application$fJohn D. Musa, Anthony Iannino, Kazuhira Okumoto
210   $aNew York$cMcGraw-Hill$dİ1987
215   $a621 p.$cill.$d22 cm
225 1 $aMcGraw-Hill series in software engineering and technology
610 0 $aSoftware
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700  1$aMusa,$bJohn D.$0492102
701  1$aIannino,$bAnthony$0492103
701  1$aOkumoto,$bKazuhira$0492104
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