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200 1 $aPARTICLE characterization in technology$fEditor John Keith Beddow.
210   $aBoca Ranton$cCrc press$dcopyr. 1984
215   $a2 voll., ill., 26 cm
225 1 $aCRC series on fine Particle science and technology
300   $av. 1: Applications and Microanalysis. v. 2: Morphological Analysis.
676   $a620
702  1$aBeddow,$bJohn Keith
801  0$aIT$bUNINA$gRICA$2UNIMARC
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996   $aPARTICLE characterization in technology$9127821
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