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200 1 $aProbabilistic reliability$ean engineering approach$fMartin L. Shooman
210   $aNew York$cMcGraw-Hill$d1968
215   $aXIX, 524 p.$cill.$d23 cm
225 1 $aMcGraw-Hill electrical and electronic engineering series
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700  1$aShooman,$bMartin L.$02693
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