LEADER 00825nam0-22003011i-450-
001 990000031580403321
035   $a000003158
035   $aFED01000003158
035   $a(Aleph)000003158FED01
035   $a000003158
100   $a20011111d--------km-y0itay50------ba
101 0 $aita
105   $ay-------001yy
200 1 $aNuove chiese in Europa$fG. E. Kidder Smith.
210   $aMilano$cEdizioni di comunita$d1964
215   $a291 p.$cill.$d29 cm
610 0 $aChiese$aEuropa
610 0 $aEuropa$aChiese
676   $a726
700  1$aSmith,$bGeorge Everard Kidder$f<1913-1997>$037345
801  0$aIT$bUNINA$gRICA$2UNIMARC
901   $aBK
912   $a990000031580403321
952   $a13 D 55 08$b32633$fFINBC
959   $aFINBC
996   $aNuove chiese in Europa$9105638
997   $aUNINA
DB    $aING01

LEADER 01106nam  2200349   450 
001 9910416160403321
005 20230820063912.0
035   $a(CKB)4100000011403737
035   $a(NjHacI)994100000011403737
035   $a(EXLCZ)994100000011403737
100   $a20230820d2020      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a49th International Conference on Parallel Processing - ICPP $eWorkshops /$fAssociation for Computing Machinery
210  1$aNew York :$cAssociation for Computing Machinery,$d2020.
215   $a1 online resource (186 pages)
311   $a1-4503-8868-X 
517   $a49th International Conference on Parallel Processing - ICPP 
606   $aComputer systems
606   $aArchitecture
615  0$aComputer systems.
615  0$aArchitecture.
676   $a004
801  0$bNjHacI
801  1$bNjHacl
906   $aBOOK
912   $a9910416160403321
996   $a49th International Conference on Parallel Processing - ICPP$92255853
997   $aUNINA

LEADER 01996nas  2200541-a 450 
001 996279895103316
005 20240202213016.0
035   $a(OCoLC)135066057
035   $a(CKB)1000000000428473
035   $a(CONSER)--2007242231
035   $a(EXLCZ)991000000000428473
100   $a20070524b20032016  s--         a
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aProceedings /$fIEEE International On-Line Testing Symposium
210   $aLos Alamitos, Calif. $cIEEE Computer Society$dİ2003-
300   $aTitle from PDF of original t.p. (IEEE Xplore, viewed May 24, 2007).
311   $a1942-9398 
517 3 $aIOLTS
531 0 $aProc.
606   $aElectronic circuits$xTesting$vCongresses
606   $aOnline data processing$vCongresses
606   $aElectronic circuit design$vCongresses
606   $aError-correcting codes (Information theory)$vCongresses
606   $aElectronic circuit design$2fast$3(OCoLC)fst00906862
606   $aElectronic circuits$xTesting$2fast$3(OCoLC)fst00906898
606   $aError-correcting codes (Information theory)$2fast$3(OCoLC)fst00915036
606   $aOnline data processing$2fast$3(OCoLC)fst01045942
608   $aPeriodicals.$2fast
608   $aConference papers and proceedings.$2fast
615  0$aElectronic circuits$xTesting
615  0$aOnline data processing
615  0$aElectronic circuit design
615  0$aError-correcting codes (Information theory)
615  7$aElectronic circuit design.
615  7$aElectronic circuits$xTesting.
615  7$aError-correcting codes (Information theory)
615  7$aOnline data processing.
676   $a621
712 02$aInstitute of Electrical and Electronics Engineers.
712 02$aIEEE Computer Society.$bTechnical Council on Test Technology.
906   $aCONFERENCE
912   $a996279895103316
996   $aProceedings$957126
997   $aUNISA