LEADER 01430nam0 22003373i 450 
001 UBO0264026
005 20231121125852.0
010   $a0824782488
100   $a20141209d1997    ||||0itac50      ba
101 | $aeng
102   $aus
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aLinear and nonlinear models for the analysis of repeated measurements$fEdward F. Vonesh, Vernon M. Chinchilli
210   $aNew York \etc.!$cMarcel Dekker$dc1997
215   $aXII, 560 p.$d24 cm.$e1 dischetto.
225 | $aStatistics: textbooks and monographs$v154
410  0$1001MIL0035165$12001 $aStatistics: textbooks and monographs$v154
606   $aAnalisi multivariata$2FIR$3RMLC226161$9I
606   $aProgettazione sperimentale$2FIR$3RMLC383170$9I
676   $a519.535$9Analisi multivariata. Analisi di struttura latente$v21
700  1$aVonesh$b, Edward F.$3UBOV105515$4070$0460692
701  1$aChinchilli$b, Vernon M.$3UBOV105516$4070$01447799
801  3$aIT$bIT-01$c20141209
850   $aIT-FR0099          
899   $aBiblioteca Area Ingegneristica$bFR0099          
912   $aUBO0264026
950  0$aBiblioteca Area Ingegneristica$d 54DMS       519.5 VON$e 54VM 0000508115  VM                        barcode:BAIN005152. - Inventario:1603MVM$fA $h20041130$i20121204
977   $a 54
996   $aLinear and nonlinear models for the analysis of repeated measurements$93639729
997   $aUNICAS