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001 TO01426813
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010   $a0195107519
100   $a20110922d1993    ||||0itac50      ba
101 | $aeng
102   $agb
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aScanning and transmission electron microscopy$ean introduction$fStanley L. Flegler, John W. Heckman, Karen L. Klomparens
210   $aNew York$aOxford$cOxford University Press$dİ1993
215   $aVIII, 225 p.$d26 cm.
606   $aMicroscopio elettronico$2FIR$3RMLC380675$9I
676   $a502.825$9$v21
700  1$aFlegler$b, Stanley L.$3TO0V549710$4070$01447597
701  1$aHeckman$b, John W.$3TO0V549711$4070$01447598
701  1$aKlomparens$b, Karen L.$3UANV001139$4070$01447599
801  3$aIT$bIT-01$c20110922
850   $aIT-RM1163          $aIT-FR0099          
899   $aIstituto Centrale Restauro Conservazione Patrimonio Archivistico Librario$bRM1163          $4S
899   $aBiblioteca Area Ingegneristica$bFR0099          
912   $aTO01426813
950  0$aBiblioteca Area Ingegneristica$d 54DMS       502.8 FLE$e 54VM 0000338985  VM                        barcode:BAIN001244. - Inventario:879MVM$fA $h20030620$i20121204
977   $a 36$a 54
996   $aScanning and transmission electron microscopy$93638777
997   $aUNICAS