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010   $a0198501897
100   $a20121121d1999    ||||0itac50      ba
101 | $aeng
102   $agb
181  1$6z01$ai $bxxxe  
182  1$6z01$an
200 1 $aDefect and microstructure analysis by diffraction$fRobert L. Snyder, Jaroslav Fiala, Hans J. Bunge
210   $aOxford $cOxford University Press $d1999
215   $axxii, 785 p.$d24 cm
606   $aCristallografia$2FIR$3RMLC016679$9I
606   $aDiffrazione di polveri$2FIR$3RMLC380567$9I
606   $aMicrostruttura$2FIR$3RMLC381155$9I
676   $a548.83$9$v21
700  1$aSnyder$b, Robert L.$3RMLV171444$0100291
701  1$aBunge$b, Hans J.$3RMLV171442$01444528
701  1$aFiala$b, Jaroslav$3RMLV171443$01444529
801  3$aIT$bIT-01$c20121121
850   $aIT-FR0099          
899   $aBiblioteca Area Ingegneristica$bFR0099          
912   $aRML0266477
950  0$aBiblioteca Area Ingegneristica$d 54DMS       548 SNY$e 54VM 0000369135  VM                        barcode:BAIN004197. - Inventario:1073MVM$fA $h20031203$i20121204
977   $a 54
996   $aDefect and microstructure analysis by diffraction$93624783
997   $aUNICAS