LEADER 01242nam0 22003013i 450 
001 VAN0277430
005 20240607024403.125
017 70$20$a9783031220210
100   $a20240607d2023       |0itac50      ba
101   $aeng
102   $aCH
105   $a||||    |||||
200 1 $aOptimal Inspection Models with Their Applications$fKodo Ito, Toshio Nakagawa
210   $aCham$cSpringer$d2023
215   $aX, 261 p.$d24 cm
410  1$1001VAN0071002$12001 $aSpringer series in reliability engineering$1210  $aLondon$cSpringer$d2005-
620   $aCH$dCham$3VANL001889
700  1$aIto$bKodo$3VANV229886$01345841
701  1$aNakagawa$bToshio$3VANV055914$0724944
712   $aSpringer <editore>$3VANV108073$4650
801   $aIT$bSOL$c20240614$gRICA
856 4 $uhttps://doi.org/10.1007/978-3-031-22021-0$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth
899   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$2VAN15
912   $fN
912   $aVAN0277430
950   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$d15CONS      SBA EBOOK               13845       $e15EB 13845             20240607            
996   $aOptimal Inspection Models with Their Applications$94164559
997   $aUNICAMPANIA