LEADER 01441nam0 22003133i 450 001 VAN0243373 005 20220321095239.497 017 70$2N$a9789811522178 100 $a20220321d2020 |0itac50 ba 101 $aeng 102 $aSG 105 $a|||| ||||| 200 1 $aThermophysical Propertiesvand Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory$fRui Lan 210 $aSingapore$cSpringer$d2020 215 $aXI, 139 p.$cill.$d24 cm 620 $aSG$dSingapore$3VANL000061 676 $a620.11$cMateriali dell'ingegneria$v22 676 $a620.1$cScienze dei materiali$v22 676 $a541.377$cSemiconduttori$v22 700 1$aLan$bRui$3VANV198878$01063925 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttps://rd.springer.com/book/10.1007/978-981-15-2217-8$zE-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$1IT-CE0101$2VAN17 912 $fN 912 $aVAN0243373 950 $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$d17CONS e-book 2221 $e17BIB2221/20 20 20220321 996 $aThermophysical Propertiesvand Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory$92803377 997 $aUNICAMPANIA