LEADER 01642nam0 22003613i 450 001 VAN0243349 005 20220926114452.90 017 70$2N$a9783319432205 100 $a20220321d2016 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $aDielectric Breakdown in Gigascale Electronics$eTime Dependent Failure Mechanisms$fJuan Pablo Borja, Toh-Ming Lu, Joel Plawsky 210 $aCham$cSpringer$d2016 215 $aVIII, 105 p.$cill.$d24 cm 410 1$1001VAN0123245$12001 $aSpringerBriefs in Materials$1210 $aCham [etc.]$cSpringer 620 $aCH$dCham$3VANL001889 676 $a620.5$cNanotecnologia$v22 676 $a621.39$cMicroingegneria$v22 676 $a620.1$cScienze dei materiali$v22 676 $a621.319$cCircuiti$v22 700 1$aBorja$bJuan Pablo$3VANV198857$01059898 701 1$aLu$bToh-Min$3VANV198858$01213859 701 1$aPlawsky$bJoel$3VANV198859$01213860 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttps://link.springer.com/book/10.1007/978-3-319-43220-5$zE-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$1IT-CE0101$2VAN17 912 $fN 912 $aVAN0243349 950 $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$d17CONS e-book 2220 $e17BIB2220/301 301 20220321 996 $aDielectric Breakdown in Gigascale Electronics$92803372 997 $aUNICAMPANIA