LEADER 02116nam0 22004813i 450 001 VAN0208433 005 20230609110056.429 017 70$2N$a9783319753805 100 $a20210826d2018 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $aConfocal Raman Microscopy$fJan Toporski, Thomas Dieing, Olaf Hollricher editors 205 $a2. ed 210 $aCham$cSpringer$d2018 215 $axxiv, 596 p.$cill.$d24 cm 410 1$1001VAN0132874$12001 $aSpringer Series in Surface Sciences$1210 $aBerlin [etc.]$cSpringer$v66 500 1$3VAN0208434$aConfocal Raman Microscopy$91864484 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a74K35$xThin films [MSC 2020]$3VANC033952$2MF 606 $a74A50$xStructured surfaces and interfaces, coexistent phases [MSC 2020]$3VANC036162$2MF 610 $a3D Confocal Raman Imaging$9KW:K 610 $aConfocal Raman Spectroscopy Review$9KW:K 610 $aCorrelative Microscopy$9KW:K 610 $aNanospectroscopy of Individual Carbon Nanotubes$9KW:K 610 $aRaman Imaging of Plant Cell Walls$9KW:K 610 $aRaman Imaging of Polymeric Materials$9KW:K 610 $aRaman Micro-Spectral Imaging$9KW:K 610 $aRaman Microscopy in Microbiology$9KW:K 610 $aStress Analysis by Raman Microscopy$9KW:K 620 $aCH$dCham$3VANL001889 702 1$aDieing$bThomas$3VANV180261 702 1$aHollricher$bOlaf$3VANV180262 702 1$aToporski$bJan$3VANV180260 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttp://doi.org/10.1007/978-3-319-75380-5$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN0208433 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08CONS e-book 3493 $e08eMF3493 20210826 996 $aConfocal Raman Microscopy$91864484 997 $aUNICAMPANIA