LEADER 02293nam0 2200517 i 450 001 VAN0127165 005 20230627025936.204 017 70$2N$a9783030207090 100 $a20200226d2019 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $aStatistical Quality Technologies$eTheory and Practice$fYuhlong Lio ?$bet al.] editors 210 $aCham$cSpringer$d2019 215 $axix, 402 p.$cill.$d24 cm 410 1$1001VAN0113306$12001 $aICSA book series in statistics$1210 $aBerlin [etc.]$cSpringer 500 1$3VAN0237000$aStatistical Quality Technologies$91733536 606 $a62-XX$xStatistics [MSC 2020]$3VANC022998$2MF 606 $a62Nxx$xSurvival analysis and censored data [MSC 2020]$3VANC027776$2MF 606 $a62P30$xApplications of statistics in engineering and industry; control charts [MSC 2020]$3VANC030774$2MF 610 $aAcceptance Sampling Plans$9KW:K 610 $aAverage Run Length$9KW:K 610 $aBayesian Sampling Plan$9KW:K 610 $aCumulative Sum Chart$9KW:K 610 $aDegradation Data Analysis$9KW:K 610 $aEconomical Sampling Plans$9KW:K 610 $aExponentially Weighted Moving Average Control Chart$9KW:K 610 $aIndustrial Statistics$9KW:K 610 $aMultiple Deferred State Sampling Plan$9KW:K 610 $aNonparametric Control Chart$9KW:K 610 $aProcess capability index$9KW:K 610 $aReliability Testing$9KW:K 610 $aSequential Design$9KW:K 610 $aStatistical System Monitoring (SSM)$9KW:K 610 $aStatistical process control$9KW:K 620 $aCH$dCham$3VANL001889 702 1$aLio$bYuhlong$3VANV098606 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20240614$gRICA 856 4 $uhttp://doi.org/10.1007/978-3-030-20709-0$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN0127165 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08CONS e-book 1752 $e08eMF1752 20200226 996 $aStatistical Quality Technologies$91733536 997 $aUNICAMPANIA