LEADER 01157nam0 22002773i 450 001 VAN0118992 005 20181218111751.266 010 $a88-324-5111-5 100 $a20181218d1991 |0itac50 ba 101 $aita 102 $aIT 105 $a|||| ||||| 200 1 $aFusioni e scissioni societarie$ecommento al Decreto legislativo 16 gennaio 1991, n$h22 di recepimento della 3$he 6. direttiva comunitaria$eriflessi in tema di leggi antitrust$fMarco Confalonieri 205 $aMilano : Pirola, 1991 210 $aIX$d151 p. ; 24 cm 215 $aSegue appendice 410 1$1001VAN0118991$12001 $aPirola azienda$1210 $aMilano$cPirola.$v96 620 $dMilano$3VANL000284 700 1$aConfalonieri$bMarco$3VANV008121$0105831 712 $aPirola $3VANV107884$4650 801 $aIT$bSOL$c20240503$gRICA 899 $aBIBLIOTECA DEL DIPARTIMENTO DI GIURISPRUDENZA$1IT-CE0105$2VAN00 912 $aVAN0118992 950 $aBIBLIOTECA DEL DIPARTIMENTO DI GIURISPRUDENZA$d00CONS BNA.397 $e00BNA3492 20181218 996 $aFusioni e scissioni societarie$9418535 997 $aUNICAMPANIA LEADER 02052nam0 22005053i 450 001 VAN00283898 005 20250218035930.185 017 70$2N$a9783030861742 100 $a20241210d2022 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 181 $ai$b e 182 $ab 200 1 $aTheory and Practice of Thermal Transient Testing of Electronic Components$fMarta Rencz, Gábor Farkas, András Poppe editors 210 $aCham$cSpringer$d2022 215 $aix, 385 p.$cill.$d24 cm 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a78-XX$xOptics, electromagnetic theory [MSC 2020]$3VANC022356$2MF 606 $a94-XX$xInformation and communication theory, circuits [MSC 2020]$3VANC019701$2MF 610 $aBipolar transistors$9KW:K 610 $aCapacitors$9KW:K 610 $aIGBT devices$9KW:K 610 $aMOS transistors$9KW:K 610 $aReliability Testing$9KW:K 610 $aResistors$9KW:K 610 $aSi diodes$9KW:K 610 $aStructure integrity testing$9KW:K 610 $aThermal characterization$9KW:K 610 $aThermal testing$9KW:K 610 $aThermal transient testing$9KW:K 610 $aWide bandgap materials$9KW:K 620 $aCH$dCham$3VANL001889 702 1$aFarkas$bGábor$3VANV237578 702 1$aPoppe$bAndrás$3VANV237579 702 1$aRencz$bMarta$3VANV237577 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20250221$gRICA 856 4 $uhttps://doi.org/10.1007/978-3-030-86174-2$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00283898 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-Book 10105 $e08eMF10105 20241219 996 $aTheory and Practice of Thermal Transient Testing of Electronic Components$93091260 997 $aUNICAMPANIA