LEADER 01185nam0 2200289 i 450 
001 VAN0109054
005 20230628123621.320
010   $a978-14-939275-1-7
100   $a20170508d2015       |0itac50      ba
101   $aeng
102   $aUS
105   $a||||    |||||
200 1 $aSilicon Analog Components$eDevice Design, Process Integration, Characterization, and Reliability$fBadih El-Kareh, Lou N. Hutter
210   $aNew York$cSpringer$d2015
215   $aXLI, 607 p.$d24 cm
620   $aUS$dNew York$3VANL000011
700  1$aEl-Kareh$bBadih$3VANV084338$0720566
701  1$aHutter$bLou N.$3VANV084339$0720565
712   $aSpringer <editore>$3VANV108073$4650
801   $aIT$bSOL$c20240614$gRICA
856 4 $uhttps://link.springer.com/book/10.1007/978-1-4939-2751-7$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth
899   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$2VAN15
912   $fN
912   $aVAN0109054
950   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$d15CONS      SBA EBOOK 1100                      $e15EB 1100              20170508            
996   $aSilicon Analog Components$91412197
997   $aUNICAMPANIA