LEADER 01448nam0 2200289 i 450 
001 VAN0073632
005 20221212124935.12
010   $a978-98-10-21758-7
100   $a20100128d1994       |0itac50      ba
101   $aeng
102   $aSG
105   $a||||    |||||
200 1 $aAdvanced mathematical tools in metrology$eproceedings of the international workshop, Villa Gualino, Torino (Italy), October 20-22, 1993$fP. Ciarlini ... [et al.] editors
210   $aSingapore$cWorld scientific$d1994
215   $aIX, 273 p.$cill.$d23 cm
410  1$1001VAN0027089$12001 $aSeries on advances in mathematics for applied sciences$1210  $aSingapore$cWorld scientific$v16
606   $a62-XX$xStatistics [MSC 2020]$3VANC022998$2MF
620   $aSG$dSingapore$3VANL000061
702  1$aCiarlini$bPatrizia$3VANV022571
712   $aWorld Scientific <editore>$3VANV108634$4650
801   $aIT$bSOL$c20240412$gRICA
856 4 $u/sebina/repository/catalogazione/documenti/Ciarlini et al. - Advanced mathematical tools in metrology.pdf$zCiarlini et al. - Advanced mathematical tools in metrology.pdf
899   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08
912   $aVAN0073632
950   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08PREST     62-XX                   0796        $e08   8782      I       20101025            
996   $aAdvanced mathematical tools in metrology$91415122
997   $aUNICAMPANIA