LEADER 01008nam0 22002651i 450 
001 VAN0045749
005 20240314114138.906
010   $a05-214-6196-0
100   $a20060529d1996       |0itac50      ba
101   $aeng
102   $aUS
105   $a||||    |||||
200 1 $aPhotoinduced defects in semiconductors$fDavid Redfield, Richard H. Bube
210   $aCambridge$cCambridge university$d1996
215   $aX, 217 p.$cill.$d23 cm
620   $dCambridge$3VANL000024
700  1$aRedfield$bDavid$3VANV036662$0726820
701  1$aBube$bRichard H.$3VANV036663$0602644
712   $aCambridge university <editore>$3VANV107986$4650
801   $aIT$bSOL$c20240315$gRICA
899   $aBIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$1IT-CE0100$2VAN05
912   $aVAN0045749
950   $aBIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$d05PREST     J III 111                           $e05   3213              20060529            
996   $aPhotoinduced defects in semiconductors$91422444
997   $aUNICAMPANIA