LEADER 01296nam0 22003853i 450 001 VAN00300567 005 20251117102818.603 017 70$2N$a9780387225937 100 $a20251117d1999 |0itac50 ba 101 $aeng 102 $aUS 105 $a|||| ||||| 181 $ai$b e 182 $ab 183 $acr 200 1 $aStochastic Models in Reliability$fTerje Aven, Uwe Jensen 210 $aNew York$cSpringer$d1999 215 $axii, 270 p.$cill.$d24 cm 410 1$1001VAN00076490$12001 $aStochastic modelling and applied probability$1210 $aNew York [etc.]$cSpringer$v41 610 $aMaintenance$9KW:K 610 $aOptimization$9KW:K 610 $aQuality control$9KW:K 610 $aReliability$9KW:K 610 $aSafety and Risk$9KW:K 610 $aStochastic processes$9KW:K 620 $aUS$dNew York$3VANL000011 700 1$aAven$bTerje$3VANV255019$044036 701 1$aJensen$bUwe$3VANV255020$044037 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20251121$gRICA 856 4 $uhttps://doi.org/10.1007/b97596$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 912 $fN 912 $aVAN00300567 996 $aStochastic models in reliability$983271 997 $aUNICAMPANIA