LEADER 02131nam0 22005053i 450 001 VAN00284168 005 20251031100757.204 017 70$2N$a9789811695698 100 $a20241216d2022 |0itac50 ba 101 $aeng 102 $aSG 105 $a|||| ||||| 181 $ai$b e 182 $ab 183 $acr 200 1 $aMaterial Characterization Techniques and Applications$fEuth Ortiz Ortega ... [et al.] 210 $aSingapore$cSpringer$d2022 215 $axv, 305 p.$cill.$d24 cm 410 1$1001VAN00108129$12001 $aProgress in Optical Science and Photonics$1210 $aCham$cSpringer$d2013-$v19 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a78-XX$xOptics, electromagnetic theory [MSC 2020]$3VANC022356$2MF 610 $aAtomic Force Microscopy$9KW:K 610 $aDRIFT Spectroscopy$9KW:K 610 $aElectrochemical Impedance Spectroscopy$9KW:K 610 $aFourier-transform Infrared spectroscopy$9KW:K 610 $aHigh-Performance Liquid Chromatography$9KW:K 610 $aMALDI-TOF Spectrometry$9KW:K 610 $aOptical Microscopy$9KW:K 610 $aRaman spectroscopy$9KW:K 610 $aScanning Electron Microscopy$9KW:K 610 $aThermal gravimetric analysis$9KW:K 610 $aTransmission Electron Microscopy$9KW:K 610 $aWettability Analysis$9KW:K 610 $aX-Ray Photoelectron Spectroscopy$9KW:K 620 $aSG$dSingapore$3VANL000061 702 1$aOrtiz Ortega$bEuth$3VANV237923 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20251107$gRICA 856 4 $uhttps://doi.org/10.1007/978-981-16-9569-8$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00284168 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-Book 10172 $e08eMF10172 20241220 996 $aMaterial Characterization Techniques and Applications$94300587 997 $aUNICAMPANIA