LEADER 02052nam0 22005053i 450 001 VAN00283898 005 20250218035930.185 017 70$2N$a9783030861742 100 $a20241210d2022 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 181 $ai$b e 182 $ab 200 1 $aTheory and Practice of Thermal Transient Testing of Electronic Components$fMarta Rencz, Gábor Farkas, András Poppe editors 210 $aCham$cSpringer$d2022 215 $aix, 385 p.$cill.$d24 cm 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a78-XX$xOptics, electromagnetic theory [MSC 2020]$3VANC022356$2MF 606 $a94-XX$xInformation and communication theory, circuits [MSC 2020]$3VANC019701$2MF 610 $aBipolar transistors$9KW:K 610 $aCapacitors$9KW:K 610 $aIGBT devices$9KW:K 610 $aMOS transistors$9KW:K 610 $aReliability Testing$9KW:K 610 $aResistors$9KW:K 610 $aSi diodes$9KW:K 610 $aStructure integrity testing$9KW:K 610 $aThermal characterization$9KW:K 610 $aThermal testing$9KW:K 610 $aThermal transient testing$9KW:K 610 $aWide bandgap materials$9KW:K 620 $aCH$dCham$3VANL001889 702 1$aFarkas$bGábor$3VANV237578 702 1$aPoppe$bAndrás$3VANV237579 702 1$aRencz$bMarta$3VANV237577 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20250221$gRICA 856 4 $uhttps://doi.org/10.1007/978-3-030-86174-2$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00283898 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-Book 10105 $e08eMF10105 20241219 996 $aTheory and Practice of Thermal Transient Testing of Electronic Components$93091260 997 $aUNICAMPANIA