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001 VAN00279684
005 20240806101554.419
017 70$2N$a9783031273162
100   $a20240712d2023       |0itac50      ba
101   $aeng
102   $aCH
105   $a||||    |||||
200 1 $aWhich Is Better (WIB): Problems in Reliability Theory$fSatoshi Mizutani, Xufeng Zhao, Toshio Nakagawa
210   $aCham$cSpringer$d2023
215   $aIX, 278 p.$d24 cm
410  1$1001VAN00071002$12001 $aSpringer series in reliability engineering$1210  $aLondon$cSpringer$d2005-
620   $aCH$dCham$3VANL001889
700  1$aMizutani$bSatoshi$3VANV232154$01358291
701  1$aNakagawa$bToshio$3VANV055914$0724944
701  1$aZhao$bXufeng$3VANV084808$0739894
712   $aSpringer <editore>$3VANV108073$4650
801   $aIT$bSOL$c20240906$gRICA
856 4 $uhttps://doi.org/10.1007/978-3-031-27316-2$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth
899   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$2VAN15
912   $fN
912   $aVAN00279684
950   $aBIBLIOTECA CENTRO DI SERVIZIO SBA$d15CONS      SBA EBOOK               14272       $e15EB 14272             20240712            
996   $aWhich Is Better (WIB): Problems in Reliability Theory$94176217
997   $aUNICAMPANIA