LEADER 01448nam0 22003013i 450 
001 VAN00275696
005 20240806101543.433
010   $a978-98-14-67861-2
100   $a20240508d2015       |0itac50      ba
101   $aeng
102   $aSG
105   $a||||    |||||
200 1 $aAdvanced mathematical and computational tools in metrology and testing X$fedited by F. Pavese ... [et al.]
210   $aSingapore$cWorld scientific$d2015
215   $axi, 429 p.$cill.$d24 cm
410  1$1001VAN00027089$12001 $aSeries on advances in mathematics for applied sciences$1210  $aSingapore$cWorld scientific$v86
606   $a62-XX$xStatistics [MSC 2020]$3VANC022998$2MF
606   $a62P30$xApplications of statistics in engineering and industry; control charts [MSC 2020]$3VANC030774$2MF
606   $a68Uxx$xComputing methodologies and applications [MSC 2020]$3VANC019673$2MF
620   $aSG$dSingapore$3VANL000061
702  1$aPavese$bFranco$3VANV059042$4340
712   $aWorld Scientific <editore>$3VANV108634$4650
801   $aIT$bSOL$c20240906$gRICA
899   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08
912   $aVAN00275696
950   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08PREST     68-XX                   3179        $e08DMF934       III     20240508            
996   $aAdvanced mathematical and computational tools in metrology and testing X$94208792
997   $aUNICAMPANIA