LEADER 01377nam0 2200301 i 450 
001 VAN0027081
005 20151120101600.498
010   $a98-10-22618-7
100   $a20041103d1996       |0itac50      ba
101   $aeng
102   $aIN
105   $a||||    |||||
200 1 $aAdvanced mathematical tools in metrology 2.$fedited by P. Ciarlini... [et al.]
210   $aSingapore$cWorld Scientic$d1996
215   $aix, 287 p.$d23 cm.
410  1$1001VAN0027089$12001 $aSeries on advances in mathematics for applied sciences$1210  $aSingapore$cWorld scientific$v40
606   $a00B25$xProceedings of conferences of miscellaneous specific interest [MSC 2020]$3VANC020732$2MF
606   $a62Nxx$xSurvival analysis and censored data [MSC 2020]$3VANC027776$2MF
606   $a62Pxx$xApplications of statistics [MSC 2020]$3VANC027777$2MF
620   $aSG$dSingapore$3VANL000061
702  1$aCiarlini$bPatrizia$3VANV022571
712   $aWorld Scientific <editore>$3VANV108634$4650
801   $aIT$bSOL$c20240412$gRICA
899   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08
912   $aVAN0027081
950   $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08PREST     62-XX                   0796        $e08OM 108       II      20041103            
996   $aAdvanced mathematical tools in metrology 2$91432127
997   $aUNICAMPANIA