LEADER 02104nam0 22004693i 450 001 VAN00211395 005 20250604053114.441 017 70$2N$a9783319998251 100 $a20210906d2018 |0itac50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $aLock-in Thermography$eBasics and Use for Evaluating Electronic Devices and Materials$fOtwin Breitenstein, Wilhelm Warta, Martin C. Schubert 205 $a3. ed 210 $aCham$cSpringer$d2018 215 $axxi, 321 p.$cill.$d24 cm 410 1$1001VAN00063131$12001 $aSpringer series in advanced microelectronics$1210 $aBerlin [etc.]$cSpringer$v10 500 1$3VAN00211396$aLock-in Thermography$92779721 606 $a00A79 (77-XX)$xPhysics [MSC 2020]$3VANC023182$2MF 606 $a78A60$xLasers, masers, optical bistability, nonlinear optics [MSC 2020]$3VANC029030$2MF 610 $aElectronic Device Failure Analysis$9KW:K 610 $aIC Failure Analysis$9KW:K 610 $aIlluminated LIT applied to solar cells$9KW:K 610 $aLIT application to spin caloritronics problems$9KW:K 610 $aNon-thermal LIT lifetime mapping$9KW:K 610 $aPower devices for electric cars$9KW:K 610 $aShunt Imaging$9KW:K 610 $aSolar Cells$9KW:K 610 $aTrap Density Mapping$9KW:K 620 $aCH$dCham$3VANL001889 700 1$aBreitenstein$bOtwin$3VANV182051$01063465 701 1$aSchubert$bMartin C.$3VANV182053$01076487 701 1$aWarta$bWilhelm$3VANV182052$0324087 712 $aSpringer $3VANV108073$4650 801 $aIT$bSOL$c20250606$gRICA 856 4 $uhttp://doi.org/10.1007/978-3-319-99825-1$zE-book ? Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth 899 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$1IT-CE0120$2VAN08 912 $fN 912 $aVAN00211395 950 $aBIBLIOTECA DEL DIPARTIMENTO DI MATEMATICA E FISICA$d08DLOAD e-book 3581 $e08eMF3581 20210906 996 $aLock-in Thermography$92779721 997 $aUNICAMPANIA