LEADER 01594nam0 2200385 i 450 
001 VAN00124603
005 20251212015855.614
017 70$2N$a9783319595733
100   $a20191022d2018       |0itac50      ba
101   $aeng
102   $aCH
105   $a||||    |||||
181   $ai$b   e  
182   $ab
183   $acr
200 1 $aIndustrial X-Ray Computed Tomography$fSimone Carmignato, Wim Dewulf, Richard Leach editors
210   $aCham$cSpringer$d2018
215   $aVII, 369 p.$cill.$d24 cm
620   $aCH$dCham$3VANL001889
676   $a621.36$cIngegneria ottica. Ottica applicata$v22
676   $a620.1$cScienze dei materiali$v22
676   $a523.019$cFisica molecolare, atomica, nucleare$v22
676   $a530.44$cFisica del plasma$v22
702  1$aCarmignato$bSimone$3VANV096033
702  1$aDewulf$bWim$3VANV096034
702  1$aLeach$bRichard$3VANV096035
712   $aSpringer <editore>$3VANV108073$4650
801   $aIT$bSOL$c20251219$gRICA
856 4 $uhttps://link.springer.com/book/10.1007/978-3-319-59573-3$zE-book - Accesso al full-text attraverso riconoscimento IP di Ateneo, proxy e/o Shibboleth
899   $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$1IT-CE0101$2VAN17
912   $fN
912   $aVAN00124603
950   $aBIBLIOTECA DEL DIPARTIMENTO DI SCIENZE E TECNOLOGIE AMBIENTALI BIOLOGICHE E FARMACEUTICHE$d17CONS      e-book                  2112        $e17BIB2112/13   13      20191022            
996   $aIndustrial X-Ray Computed Tomography$91565452
997   $aUNICAMPANIA