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001 VAN00029959
005 20240806100342.602
010   $a35-405-8479-X
100   $a20041209d1995       |0itac50      ba
101   $aeng
102   $aUS
105   $a||||    |||||
200 1 $aEnergy-filtering transmission electron microscopy$fLudwig Reimer (ed.)$gwith contributions by C. Deininger ... [et al.]
210   $aBerlin$aHeidelberg$cSpringer$d1995
215   $aXIII, 424 p.$cill.$d25 cm
410  1$1001VAN00021015$12001 $aSpringer series in optical sciences$1210  $aBerlin [etc.]$cSpringer$v71
620   $dBerlin$3VANL000066
700  1$aReimer$bLudwig$3VANV024799$014910
712   $aSpringer <editore>$3VANV108073$4650
801   $aIT$bSOL$c20240906$gRICA
856 4 $uhttps://link.springer.com/content/pdf/bfm:978-3-540-48995-5/1?pdf=chapter%20toc$zhttps://link.springer.com/content/pdf/bfm:978-3-540-48995-5/1?pdf=chapter%20toc
856 4 $uhttps://link.springer.com/book/10.1007/978-3-540-48995-5$zhttps://link.springer.com/book/10.1007/978-3-540-48995-5
899   $aBIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$1IT-CE0100$2VAN05
912   $aVAN00029959
950   $aBIBLIOTECA DEL DIPARTIMENTO DI INGEGNERIA$d05PREST     K 169                               $e05   1426              20041209            $sBuono
996   $aEnergy-filtering transmission electron microscopy$91431593
997   $aUNICAMPANIA