LEADER 01078cam0-22003731i-450- 001 990000383510403321 005 20061020114500.0 035 $a000038351 035 $aFED01000038351 035 $a(Aleph)000038351FED01 035 $a000038351 100 $a20020821d1964----km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aConferenze su argomenti vari di chimica$fV. Gutmann, J. P. Adloff, F. Seel 210 $aRoma$cCNR$d1964 215 $a45 p.$d24 cm 225 1 $aQuaderni di chimica$v2 300 $aIn testa al front.: Consiglio Nazionale delle Ricerche 676 $a540 676 $a546 702 1$aAdloff,$bJean-Pierre 702 1$aGutmann,$bV. 702 1$aSeel,$bFritz 712 02$aConsiglio nazionale delle ricerche 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990000383510403321 952 $a04 060-88/2B$bCI$fDINCH 952 $a04 060-88/2A$bCI$fDINCH 952 $a04 062-54$bCI$fDINCH 959 $aDINCH 996 $aCONFERENZE su argomenti vari di chimica$9128404 997 $aUNINA LEADER 01015nam1 2200253 i 450 001 SUN0109128 005 20170516024415.306 010 $d0.00 100 $a20170511g2015 |0engc50 ba 101 $aeng 102 $aCH 105 $a|||| ||||| 200 1 $a*Multiphase Flow Dynamics$fNikolay Ivanov Kolev 210 $aCham$cSpringer 215 $avolumi$d24 cm. 463 1$1001SUN0109129$12001 $a1: *Fundamentals$fNikolay Ivanov Kolev$v1$1205 $aCham : Springer, 2015$1210 $aXLIV$d840 p. ; 24 cm$1215 $aPubblicazione in formato elettronico 463 1$1001SUN0109130$12001 $a5: *Nuclear Thermal Hydraulics$fNikolay Ivanov Kolev$v5$1205 $aCham : Springer, 2015$1210 $aXXXIX$d886 p. ; 24 cm$1215 $aPubblicazione in formato elettronico 620 $aCH$dCham$3SUNL001889 700 1$aKolev$b, Nikolay Ivanov$3SUNV084411$0288387 712 $aSpringer$3SUNV000178$4650 801 $aIT$bSOL$c20200921$gRICA 912 $aSUN0109128 996 $aMultiphase Flow Dynamics$9834119 997 $aUNICAMPANIA LEADER 06822nam 2200709 450 001 9910462825803321 005 20200520144314.0 010 $a1-283-99156-X 010 $a1-60650-393-6 024 7 $a10.5643/9781606503935 035 $a(CKB)2670000000326486 035 $a(EBL)1048456 035 $a(OCoLC)827212971 035 $a(SSID)ssj0000970205 035 $a(PQKBManifestationID)11552066 035 $a(PQKBTitleCode)TC0000970205 035 $a(PQKBWorkID)11001486 035 $a(PQKB)10487189 035 $a(OCoLC)829322779 035 $a(CaBNvSL)swl00402170 035 $a(MiAaPQ)EBC1048456 035 $a(Au-PeEL)EBL1048456 035 $a(CaPaEBR)ebr10661538 035 $a(CaONFJC)MIL430406 035 $a(EXLCZ)992670000000326486 100 $a20180728d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray fluorescence spectrometry and related techniques $ean introduction /$fEva Margui?, Rene? van Grieken 210 1$aNew York, New York :$cMomentum Press,$d[2013] 210 4$dİ2013 215 $a1 online resource (162 p.) 300 $aDescription based upon print version of record. 311 $a1-60650-391-X 320 $aIncludes bibliographical references and index. 327 $aPreface -- Series preface -- Series editor -- About the authors -- 327 $a1. Introduction -- 1.1 Basic principles of x-ray fluorescence -- 1.2 Interactions of x-rays with matter -- 1.3 X-ray safety and protection -- 327 $a2. Basic components of x-ray fluorescence spectrometers -- 2.1 General introduction -- 2.2 Excitation sources -- 2.2.1 X-ray tubes -- 2.2.2 Radioisotopes -- 2.2.3 Other sources -- 2.3 Sample chamber -- 2.4 Detection system -- 2.4.1 Types of detectors -- 2.4.1.1 Gas-filled detectors -- 2.4.1.2 Scintillation detectors -- 2.4.1.3 Solid-state detectors -- 2.4.2 Resolution and efficiency -- 2.4.2.1 Resolution -- 2.4.2.2 Efficiency -- 2.4.3 Comparison of detection systems -- 2.4.4 Detector artifacts -- 2.4.4.1 Escape peaks -- 2.4.4.2 Sum peaks (pile-up effect) -- 2.4.5 Signal processing system -- 2.5 Source and detector modifiers -- 2.5.1 Filters -- 2.5.1.1 Primary filters -- 2.5.1.2 Detector filters -- 2.5.2 Secondary targets -- 2.5.3 Focusing optics -- 2.5.4 Dispersing systems -- 2.5.5 Collimators -- 2.5.6 Masks -- 2.6 Instrument configurations -- 327 $a3. Qualitative and quantitative x-ray fluorescence analysis -- 3.1 Evaluation of x-ray fluorescence spectra -- 3.2 Qualitative XRF analysis -- 3.3 Quantitative XRF analysis -- 3.3.1 Chemical matrix effects -- 3.3.1.1 Absorption effects -- 3.3.1.2 Enhancement effects -- 3.3.2 Correction and compensation methods -- 3.3.2.1 Compensation methods -- 3.3.2.2 Matrix correction methods -- 3.3.2.3 Overview of correction and compensation methods -- 3.3.3 Quality of XRF analytical results -- 3.3.3.1 Limits of detection (LOD) and quantification (LOQ) -- 3.3.3.2 Working range and linearity -- 3.3.3.3 Precision and accuracy -- 3.3.3.4 Quality control of the results -- 327 $a4. Sample preparation procedures -- 4.1 Introduction -- 4.2 General sample preparation procedures -- 4.2.1 Solid samples -- 4.2.1.1 Direct XRF analysis -- 4.2.1.2 Powdered specimen -- 4.2.1.3 Fused specimen -- 4.2.1.4 Digested specimen -- 4.2.2 Liquid samples -- 4.2.2.1 Preconcentration methods -- 4.3 Specific sample preparation procedures -- 327 $a5. Wavelength/energy dispersive x-ray fluorescence spectrometry (WDXRF/EDXRF) -- 5.1 Introduction and basic principles -- 5.2 WDXRF and EDXRF layouts -- 5.2.1 WDXRF instrumentation -- 5.2.2 EDXRF instrumentation -- 5.3 Comparison of WDXRF and EDXRF systems -- 5.4 Applications of WDXRF and case studies -- 5.4.1 Determination of metal residues in active pharmaceutical ingredients -- 5.4.2 Determination of heavy metal content in automotive -- shredder residues (ASR) -- 5.4.3 Metal determination in polluted soils and waters -- 5.5 Applications of EDXRF and case studies -- 5.5.1 Determination of heavy metals at trace levels in vegetation samples -- 5.5.2 Determination of Cu, Ni, Zn, Pb, and Cd in aqueous samples -- 5.5.3 Chemical characterization of aerosol samples -- 327 $a6. Total Reflection X-Ray Spectrometry (TXRF) -- 6.1 Introduction and basic principles -- 6.2 TXRF layout -- 6.3 Analytical capabilities of TXRF systems -- 6.3.1 Chemical analysis -- 6.3.1.1 Sample carriers -- 6.3.1.2 Sample treatment procedures for chemical analysis by TXRF -- 6.3.1.3 Quantification -- 6.3.2 Surface analysis -- 6.4 Other applications of TXRF and case studies -- 6.4.1 Multielement determination in waste water effluents -- 6.4.2 Determination of trace amounts of Se in soil samples -- 6.4.3 Analysis of Si wafer surfaces -- 327 $a7. Special XRF configurations and related techniques -- 7.1 Introduction -- 7.2 Microbeam X-ray fluorescence spectrometry ([mu]-XRF) -- 7.3 Synchrotron radiation-induced X-ray emission (SRXRF or SRIXE) -- 7.4 Particle-induced X-ray emission (PIXE) -- 7.5 Electron-induced X-ray emission -- 7.5.1 Scanning electron microscope (SEM) -- 7.5.2 Electron microprobe analysis (EMPA) -- 327 $a8. Overview of XRF and related techniques -- 8.1 Introduction -- 8.2 Comparative performance of XRF systems -- 8.3 Role of XRF spectrometry in analysis field -- 8.4 Future perspectives -- 327 $aBuyer's guide to manufacturers -- Glossary of abbreviations and acronyms -- References -- Bibliography -- Books and encyclopedia chapters -- Journals -- Index. 330 3 $aX-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. 606 $aX-ray spectroscopy 608 $aElectronic books. 615 0$aX-ray spectroscopy. 676 $a543.08586 700 $aMargui?$b Eva$0946172 702 $aGrieken$b R. van$g(Rene?), 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910462825803321 996 $aX-ray fluorescence spectrometry and related techniques$92137575 997 $aUNINA