LEADER 01339nam0 22002771i 450 
001 SUN0025089
005 20061106120000.0
100   $a20040930d1990       |0itac50      ba
101   $aita
102   $aIT
105   $a||||    |||||
200 1 $aCurzio Malaparte$e"Casa come me" Punta del Massullo, tel. 160, Capri$fSergio Attanasio$gpresentazione di Massimo Rosi
210   $aNapoli$cArte tipografica$d1990
215   $a91 p.$cill.$d31 cm.
620   $dNapoli$3SUNL000005
700  1$aAttanasio$b, Sergio$3SUNV020771$024880
702  1$aRosi$b, Massimo$3SUNV013965
712   $aArte tipografica$3SUNV005007$4650
801   $aIT$bSOL$c20181109$gRICA
912   $aSUN0025089
950   $aBIBLIOTECA DEL DIPARTIMENTO DI  ARCHITETTURA E DISEGNO INDUSTRIALE$d01 PREST     IDb274                              $e01    51683                                 
950   $aBIBLIOTECA DEL DIPARTIMENTO DI  ARCHITETTURA E DISEGNO INDUSTRIALE$d01 PREST     IDb275                              $e01    25992                                 
995   $aBIBLIOTECA DEL DIPARTIMENTO DI  ARCHITETTURA E DISEGNO INDUSTRIALE$bIT-CE0107$h51683$kPREST IDb274$op$qa
995   $aBIBLIOTECA DEL DIPARTIMENTO DI  ARCHITETTURA E DISEGNO INDUSTRIALE$bIT-CE0107$h25992$kPREST IDb275$op$qa
996   $aCurzio Malaparte$9351151
997   $aUNICAMPANIA

LEADER 01735nam  2200397   450 
001 996279298903316
005 20230424180829.0
010   $a1-4799-3525-5
035   $a(CKB)3460000000126181
035   $a(NjHacI)993460000000126181
035   $a(EXLCZ)993460000000126181
100   $a20230424d2013      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2013 8th IEEE Design and Test Symposium /$fInstitute of Electrical and Electronics Engineers
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers (IEEE),$d2013.
215   $a1 online resource $cillustrations
311   $a1-4799-3526-3 
330   $aThe International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.
517   $aDesign and Test Symposium 
606   $aElectronic circuit design$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
615  0$aElectronic circuit design
615  0$aIntegrated circuits$xTesting
615  0$aElectronic circuits$xTesting
676   $a621
801  0$bNjHacI
801  1$bNjHacl
906   $aPROCEEDING
912   $a996279298903316
996   $a2013 8th IEEE Design and Test Symposium$92544567
997   $aUNISA