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Published by his Maiesties command 210 $aImprinted at London $cby Bonham Norton, and Iohn Bill, printers to the Kings most Excellent Maiestie$d1624 215 $a[1]+ p 300 $aA translation of: Is. f. vindicatio patris. 300 $aA fragment; title page only. 300 $aReproduction of original in the British Library. 330 $aeebo-0018 608 $aTitle pages$zEngland$y17th century. 700 $aCasaubon$b Meric$f1599-1671.$0190490 801 0$bCu-RivES 801 1$bCu-RivES 801 2$bCStRLIN 801 2$bCu-RivES 906 $aBOOK 912 $a996396091503316 996 $aThe vindication or defence of Isaac Casaubon$92315564 997 $aUNISA LEADER 05337nam 2200709 a 450 001 9911019779303321 005 20200520144314.0 010 $a9786611764654 010 $a9781281764652 010 $a1281764655 010 $a9783527620524 010 $a3527620524 010 $a9783527620531 010 $a3527620532 035 $a(CKB)1000000000540648 035 $a(EBL)712161 035 $a(SSID)ssj0000167861 035 $a(PQKBManifestationID)11161505 035 $a(PQKBTitleCode)TC0000167861 035 $a(PQKBWorkID)10179008 035 $a(PQKB)10394891 035 $a(MiAaPQ)EBC712161 035 $a(OCoLC)264621141 035 $a(Perlego)2769165 035 $a(EXLCZ)991000000000540648 100 $a20120114d1997 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aMethods II /$fedited by S. Amelinckx ... [et al.] 210 $aWeinheim $cVCH$d1997 215 $a1 online resource (509 p.) 225 0 $aHandbook of microscopy : applications in materials science, solid-state physics, and chemistry ;$v[v. 2] 300 $aDescription based upon print version of record. 311 08$a9783527294732 311 08$a3527294732 320 $aIncludes bibliographical references and index. 327 $aHandbook of Microscopy, Applications in Materials Science , Solid-state Physics and Chemistry; Contents; IV Electron Microscopy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy; 2.1.1 Introduction; 2.1.2 Instrumentation; 2.1.3 Performance; 2.1.4 Modes of Operation; 2.1.4.1 Secondary Electron Imaging; 2.1.4.2 Backscattered Electrons; 2.1.4.3 Special Techniques; 2.1.5 Conclusions; 2.1.6 References; 2.2 Scanning Transmission Electron Microscopy; 2.2.1 Introduction; 2.2.2 Scanning Transmission Electron Microscopy Imaging Modes 327 $a2.2.3 Scanning Transmission Electron Microscopy Theory2.2.4 Inelastic Scattering and Secondary Radiations; 2.2.5 Convergent-Beam and Nanodiffraction; 2.2.6 Coherent Nanodiffraction, Electron Holography, Ptychology; 2.2.7 Holography; 2.2.8 STEM Instrumentation; 2.2.9 Applications of Scanning Transmission Electron Microscopy; 2.2.10 References; 2.3 Scanning Transmission Electron Microscopy: Z Contrast; 2.3.1 Introduction; 2.3.2 Incoherent Imaging with Elastically Scattered Electrons; 2.3.3 Incoherent Imaging with Thermally Scattered Electrons 327 $a2.3.4 Incoherent Imaging using Inelastically Scattered Electrons2.3.5 Probe Channeling; 2.3.6 Applications to Materials Research; 2.3.6.1 Semiconductors; 2.3.6.2 Ceramics; 2.3.6.3 Nanocrystalline Materials; 2.3.7 References; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.4.1 Introduction; 2.4.2 Basic Principles of Auger Electron Spectroscopy (AES) and X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.1 Auger Electron Spectroscopy (AES); 2.4.2.2 X-Ray Photoelectron Spectroscopy (XPS); 2.4.2.3 Quantitative Analysis in AES and XPS 327 $a2.4.3 Scanning Auger Microscopy (SAM) and Imaging XPS2.4.3.1 Basic Principles of Imaging; 2.4.3.2 General Aspects of Analyzers; 2.4.3.3 Energy Resolution of Deflecting Electrostatic Analyzers; 2.4.3.4 Cylindrical Mirror Analyzer (CMA) versus the Concentric Hemispherical Analyzer (CHA); 2.4.3.5 Imaging Techniques; 2.4.3.6 Magnetic Fields in Imaging XPS; 2.4.4 Characteristics of Scanning Auger Microscopy Images; 2.4.4.1 General Aspects; 2.4.4.2 Background Slope Effects; 2.4.4.3 Substrate Backscattering Effects; 2.4.4.4 Topographic Effects; 2.4.4.5 Beam Current Fluctuation Effects 327 $a2.4.4.6 Edge Effects2.4.5 Conclusion; 2.4.6 References; 2.5 Scanning Microanalysis; 2.5.1 Physical Basis of Electron Probe Microanalysis; 2.5.1.1 Electron Interactions with Solids; 2.5.1.2 X-Ray Emission Spectra; 2.5.1.3 Characteristic X-Ray Spectra; 2.5.1.4 Soft X-Ray Spectra; 2.5.1.5 X-Ray Continuum; 2.5.1.6 Overview of Methods of Scanning Electron Beam Analysis; 2.5.1.7 Electron Probe X-Ray Microanalyzers; 2.5.1.8 Analytical Electron Microscopes; 2.5.1.9 Multipurpose Electron Probe Analytical Systems; 2.5.1.10 X-Ray Emission Spectrometry; 2.5.1.11 Wavelength-Dispersive Spectrometry 327 $a2.5.1.12 Energy-Dispersive Spectrometry 330 $aComprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.With the Handbook of Microscopy, scientists and engineers involved in m 517 3 $aMethods 2 517 3 $aMethods two 606 $aMicroscopy 606 $aMaterials$xMicroscopy 615 0$aMicroscopy. 615 0$aMaterials$xMicroscopy. 676 $a502.82 676 $a502/.8/2 701 $aAmelinckx$b S$050786 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911019779303321 996 $aMethods II$93061935 997 $aUNINA